000 00665naa a2200169 4500
001 69263
090 _a69263
100 _a20040322 y0pory5003 ba
200 1 _aWhat is a shelf life of a test? the effect of time on the psychometrics of a cognitive ability test battery
_fChan Kim-Yin, co-aut. Fritz Drasgow, co-aut. Linda Sawin
461 1 _aApplied Psychology
_vVol. 84, nÂș 4 (1999), p. 610-619
606 1 _aComportamento Organizacional
686 _a3600 - Psicologia Organizacional
700 1 _aKim-Yin
_bChan
701 1 _aDrasgow
_bFritz
701 1 _aSawin
_bLinda
856 4 _uhttps://catalogo.ispa.pt/opac/biblioteca/localizacao_doc/r7.htm